Authors

Call for papers in May 2024

DIR 2025 aims to provide a unique opportunity for scientists, users, equipment suppliers and more broadly all academic and industrial stakeholders to share their recent progress and to reinforce the links with an international community.

The organizing committee cordially invites all participants to propose contributions to DIR 2025, by November 30th, 2024. The abstract submissions should be done online, through the conference website.

Topics

Scientific and industry oriented talks will provide insight into the latest instrument technology, recent methods and algorithmic developments through a broad range of topics, such as:

  • Hardware related developments
  • Advances on X-ray sources and detectors
  • Robotized inspection
  • Automated inspection and monitoring, industry 4.0 & NDE 4.0
  • Phase contrast and grating interferometry techniques
  • Film and radioactive sources replacement
  • Modeling and simulation
  • Progress on modeling and simulation tools
  • Quantum computing
  • Image processing and data analysis
  • Automated inspection and monitoring
  • AI techniques applied to DR and CT
  • Defect detection & localization
  • Quantitative imaging
  • Standardization
  • Updates on standards
  • Qualification & system reliability
  • Dimensional measurements and product conformity
  • Characterization and cross-domain topics
  • Characterization of composite materials
  • Inspection for additive manufacturing
  • Multi-method and data fusion approaches (including other radiation techniques)
  • Applications in micro- and nano-technologies

Timeline

  • Call for papers: May 2024
  • Deadline for abstract submission: November 30th, 2024
  • Validation of the communications and authors: January 31st, 2025
  • Final program: February 1st, 2025
  • Registration and payment of presenting authors: until june 30th, 2025
  • Deadline for full papers: May 15th, 2025

Registration

  • Early bird rate : until April 30th, 2025
  • Full rate : Starting with May 1st, 2025

Call for papers

All selected contributions at DIR 2025, will be published on NDT.net (partner organisation), Open Access Archive of Nondestructive Testing ISSN 1435-4934 (www.ndt.net).

Guidelines

Deadline: 30 November 2024

Submission Guidelines

  • All abstracts should be submitted through the event website (www.dir2025.com) respecting the previously mentioned deadline.
  • All contributions have to be prepared in English, translation services from/into other languages cannot be provided by the organizing committee.
  • Abstracts must include a title and the affiliations of the authors and should be a summary of maximum 400 words, explaining the content, objectives, methods and conclusions of the contribution.
  • Authors are allowed to register more than one paper.

All abstracts will be reviewed by the scientific committee.

Authors will be informed about the acceptance of their contributions in February 2025. Presenting authors with accepted contributions, should register via the online form and pay the registration fee prior to the event in order to validate the final program.

 

All presented papers at DIR 2025, will be published on our partner’s website NDT.net, Open Access Archive of Nondestructive Testing ISSN 1435-4934 (www.ndt.net).

The full paper, formatted according to the template, must be received by COFREND as an electronic file by 15 May 2025. The proceedings will be available at the conference.

 

Official Language
The official language for the technical program, poster session and other events is English.

Scientific Committee

  • Marius Costin (CEA List), Chairman of DIR 2025, France
  • Pierre Calmon (CEA List), President of COFREND’s scientific committee, France
  • Adrien Stolidi (CEA List), France
  • Stefan Kasperl, EZRT, Germany
  • Uwe Zscherpel, BAM, Germany
  • Norman Uhlmann, Fraunhofer EZRT, Germany
  • Johann Kastner, FH Upper Austria
  • Simone Carmignato, UNIPD, Italy

  • Uwe Ewert, DGZfP, Germany
  • Wim Dewulf, KU Leuven, Belgium
  • Cliff Bueno, GE GRC, US
  • Christoph Heinzl, University of Passau, Germany
  • Steve Burch, ESR Technology, UK
  • Hiromasa Suzuki, University of Tokyo, Japan
  • Valérie Kaftandjian, LVA INSA, France
  • Frank Herold, Visiconsult, Germany
  • Klaus Bavendiek, YXLON, Germany